標題: A 60-nm-thick enhancement mode In0.65Ga0.35As/InAs/In0.65Ga0.35As high-electron-mobility transistor fabricated using Au/Pt/Ti non-annealed ohmic technology for low-power logic applications
作者: Fatah, Faiz Aizad
Lin, Yueh-Chin
Liu, Ren-Xuan
Yang, Kai-Chun
Lin, Tai-We
Hsu, Heng-Tung
Yang, Jung-Hsiang
Miyamoto, Yasuyuki
Iwai, Hiroshi
Hu, Chenming Calvin
Salahuddin, Sayeef
Chang, Edward Yi
材料科學與工程學系
光電系統研究所
電子工程學系及電子研究所
國際半導體學院
Department of Materials Science and Engineering
Institute of Photonic System
Department of Electronics Engineering and Institute of Electronics
International College of Semiconductor Technology
公開日期: 二月-2016
摘要: A 60-nm-thick E-mode In0.65Ga0.35As/InAs/In0.65Ga0.35As high-electron-mobility transistor (HEMT) was successfully fabricated and evaluated by using Au/Pt/Ti-based non-annealed ohmic technology for high-speed and low-power logic applications. The device exhibited a minimal SS of 69mV/decade, a lower DIBL of 30mV/V, an ION/IOFF ratio above 1.2 x 10(4) at V-DS = 0.5V and a high f(T) of 378GHz and f(max) of 214GHz at V-DS = 1.0V. These results demonstrate that non-annealed ohmic contacts can be used for fabricating E-mode In0.65Ga0.35As/InAs/In0.65Ga0.35As HEMTs with excellent electrical characteristics. The fabricated HEMTs are likely to find use in future high-speed and low-power logic applications. (C) 2016 The Japan Society of Applied Physics.
URI: http://dx.doi.org/10.7567/APEX.9.026502
http://hdl.handle.net/11536/132819
ISSN: 1882-0778
DOI: 10.7567/APEX.9.026502
期刊: APPLIED PHYSICS EXPRESS
Volume: 9
Issue: 2
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