Title: | A 60-nm-thick enhancement mode In0.65Ga0.35As/InAs/In0.65Ga0.35As high-electron-mobility transistor fabricated using Au/Pt/Ti non-annealed ohmic technology for low-power logic applications |
Authors: | Fatah, Faiz Aizad Lin, Yueh-Chin Liu, Ren-Xuan Yang, Kai-Chun Lin, Tai-We Hsu, Heng-Tung Yang, Jung-Hsiang Miyamoto, Yasuyuki Iwai, Hiroshi Hu, Chenming Calvin Salahuddin, Sayeef Chang, Edward Yi 材料科學與工程學系 光電系統研究所 電子工程學系及電子研究所 國際半導體學院 Department of Materials Science and Engineering Institute of Photonic System Department of Electronics Engineering and Institute of Electronics International College of Semiconductor Technology |
Issue Date: | Feb-2016 |
Abstract: | A 60-nm-thick E-mode In0.65Ga0.35As/InAs/In0.65Ga0.35As high-electron-mobility transistor (HEMT) was successfully fabricated and evaluated by using Au/Pt/Ti-based non-annealed ohmic technology for high-speed and low-power logic applications. The device exhibited a minimal SS of 69mV/decade, a lower DIBL of 30mV/V, an ION/IOFF ratio above 1.2 x 10(4) at V-DS = 0.5V and a high f(T) of 378GHz and f(max) of 214GHz at V-DS = 1.0V. These results demonstrate that non-annealed ohmic contacts can be used for fabricating E-mode In0.65Ga0.35As/InAs/In0.65Ga0.35As HEMTs with excellent electrical characteristics. The fabricated HEMTs are likely to find use in future high-speed and low-power logic applications. (C) 2016 The Japan Society of Applied Physics. |
URI: | http://dx.doi.org/10.7567/APEX.9.026502 http://hdl.handle.net/11536/132819 |
ISSN: | 1882-0778 |
DOI: | 10.7567/APEX.9.026502 |
Journal: | APPLIED PHYSICS EXPRESS |
Volume: | 9 |
Issue: | 2 |
Appears in Collections: | Articles |