Title: Lower confidence bounds as precision measure for truncated processes
Authors: Wu, Chia Huang
Pearn, Wen Lea
Tai, Yu Ting
Lin, Pi Chuan
工業工程與管理學系
Department of Industrial Engineering and Management
Keywords: Lower confidence bound;Moments of truncated normal;process capability index C-p
Issue Date: 2017
Abstract: Process capability index C-p has been the most popular one used in the manufacturing industry to provide numerical measures on process precision. For normally distributed processes with automatic fully inspections, the inspected processes follow truncated normal distributions. In this article, we provide the formulae of moments used for the Edgeworth approximation on the precision measurement C-p for truncated normally distributed processes. Based on the developed moments, lower confidence bounds with various sample sizes and confidence levels are provided and tabulated. Consequently, practitioners can use lower confidence bounds to determine whether their manufacturing processes are capable of preset precision requirements.
URI: http://dx.doi.org/10.1080/03610918.2015.1005234
http://hdl.handle.net/11536/133215
ISSN: 0361-0918
DOI: 10.1080/03610918.2015.1005234
Journal: COMMUNICATIONS IN STATISTICS-SIMULATION AND COMPUTATION
Volume: 46
Issue: 2
Begin Page: 1461
End Page: 1480
Appears in Collections:Articles