標題: Nanowire growth kinetics in aberration corrected environmental transmission electron microscopy
作者: Chou, Yi-Chia
Panciera, Federico
Reuter, Mark C.
Stach, Eric A.
Ross, Frances M.
電機學院
College of Electrical and Computer Engineering
公開日期: 2016
摘要: We visualize atomic level dynamics during Si nanowire growth using aberration corrected environmental transmission electron microscopy, and compare with lower pressure results from ultra-high vacuum microscopy. We discuss the importance of higher pressure observations for understanding growth mechanisms and describe protocols tominimize effects of the higher pressure background gas.
URI: http://dx.doi.org/10.1039/c6cc00303f
http://hdl.handle.net/11536/133690
ISSN: 1359-7345
DOI: 10.1039/c6cc00303f
期刊: CHEMICAL COMMUNICATIONS
Volume: 52
Issue: 33
起始頁: 5686
結束頁: 5689
Appears in Collections:Articles