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dc.contributor.authorLee, Yu-Minen_US
dc.contributor.authorChen, Chunen_US
dc.contributor.authorSong, JiaXingen_US
dc.contributor.authorPan, Kuan-Teen_US
dc.date.accessioned2017-04-21T06:48:48Z-
dc.date.available2017-04-21T06:48:48Z-
dc.date.issued2015en_US
dc.identifier.isbn978-3-9815-3704-8en_US
dc.identifier.issn1530-1591en_US
dc.identifier.urihttp://hdl.handle.net/11536/134694-
dc.description.abstractIn this work, a three-dimensional partitioning-based force-directed placer is developed to minimize coupling noise between through silicon vias (TSVs) in three-dimensional integrated circuits. TSV decoupling force is introduced and determined by the TSV coupling noise to separate TSVs with strong coupling noise. The experimental results indicate that TSV coupling noise can be effectively reduced by 36.3% on average with only 6.0% wirelength overhead. Besides, the developed 3-D placer shows great performance in wirelength that is competitive to a state-of-the-art 3-D placer.en_US
dc.language.isoen_USen_US
dc.titleA TSV Noise-Aware 3-D Placeren_US
dc.typeProceedings Paperen_US
dc.identifier.journal2015 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE)en_US
dc.citation.spage1653en_US
dc.citation.epage1658en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000380393200310en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper