標題: | Portable simulation/emulation stimulus on an industrial-strength SoC |
作者: | Torres, Francisco Srivastava, Rohit Ruiz, Javier Wen, H. -P. Bose, Mrinal Bhadra, Jayanta 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 2009 |
摘要: | Reuse of System-on-Chip (SoC) verification stimuli across various design models is a challenging problem. However, if used effectively, it significantly reduces verification time and quickly increases confidence in the robustness of a design. We use pseudo-random stimuli to drive tests on an SoC using simulation BFMs and reuse them on emulation-BFMs. Initial results on a Power Architecture (TM) Technology-based SoC demonstrate about a 100x speedup on the emulator vis-a-vis the simulator. |
URI: | http://hdl.handle.net/11536/134995 |
ISBN: | 978-1-4244-4868-5 |
ISSN: | 1089-3539 |
期刊: | ITC: 2009 INTERNATIONAL TEST CONFERENCE |
起始頁: | 623 |
結束頁: | 623 |
顯示於類別: | 會議論文 |