Stable High-Density FD/SOI SRAM with Selective Back-Gate Bias Using Dual Buried Oxide

doi:10.1109/SOI.2008.4656283

標題:	Stable High-Density FD/SOI SRAM with Selective Back-Gate Bias Using Dual Buried Oxide
作者:	Kim, Keunwoo Kuang, Jente B. Gebara, Fadi Ngo, Hung C. Chuang, Ching-Te Nowka, Kevin J. 交大名義發表 National Chiao Tung University
公開日期:	2008
URI:	http://dx.doi.org/10.1109/SOI.2008.4656283 http://hdl.handle.net/11536/135057
ISBN:	978-1-4244-1954-8
ISSN:	1078-621X
DOI:	10.1109/SOI.2008.4656283
期刊:	2008 IEEE INTERNATIONAL SOI CONFERENCE, PROCEEDINGS
起始頁:	37
結束頁:	+
Appears in Collections:	Conferences Paper