Title: A novel fully CMOS process compatible PREM for SOC applications
Authors: Yeh, CC
Wang, TH
Tsai, WJ
Lu, TC
Liao, YY
Zous, NK
Chin, CY
Chen, YR
Chen, MS
Ting, WC
Lu, CY
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Keywords: eraseless;multilevel cell (MLC);nonvolatile;multitime programming (MTP);progressive breakdown;programmable resistor with eraseless memory (PREM);system on chip (SOC)
Issue Date: 1-Mar-2005
Abstract: A novel nonvolatile memory cell named programmable resistor with eraseless memory (PREM) is proposed for system on chip applications for the first time. PREM combines a novel "eraseless" algorithm and the progressive breakdown of an ultrathin oxide. No or one extra mask is needed with a standard CMOS process. Multitime programming, multilevel cell, nonvolatility, and low-voltage operation are realized. Good reliability is demonstrated based on the result of a single cell.
URI: http://dx.doi.org/10.1109/LED.2005.843221
http://hdl.handle.net/11536/13959
ISSN: 0741-3106
DOI: 10.1109/LED.2005.843221
Journal: IEEE ELECTRON DEVICE LETTERS
Volume: 26
Issue: 3
Begin Page: 203
End Page: 204
Appears in Collections:Articles


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