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dc.contributor.author張智翔zh_TW
dc.contributor.author劉柏村zh_TW
dc.contributor.authorChang, Chih-Hsiangen_US
dc.contributor.authorLiu, Po-Tsunen_US
dc.date.accessioned2018-01-24T07:39:09Z-
dc.date.available2018-01-24T07:39:09Z-
dc.date.issued2017en_US
dc.identifier.urihttp://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070180503en_US
dc.identifier.urihttp://hdl.handle.net/11536/140370-
dc.language.isozh_TWen_US
dc.subject薄膜電晶體zh_TW
dc.subject氧化銦鎢zh_TW
dc.subject背通道蝕刻zh_TW
dc.subject通道保護層zh_TW
dc.subjectthin film transistorsen_US
dc.subjectindium tungsten oxideen_US
dc.subjectback channel etchingen_US
dc.subjectchannel passivation layeren_US
dc.title高效能氧化銦鎢薄膜電晶體元件研究與開發zh_TW
dc.titleInvestigation on High Performance Tungsten Oxide Doped Indium Oxide Semiconductor for Thin Film Transistors Applicationen_US
dc.typeThesisen_US
dc.contributor.department光電工程研究所zh_TW
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