14奈米鰭式電晶體自熱效應的新穎溫度量測方法 及其對傳輸機制之影響

Title:	14奈米鰭式電晶體自熱效應的新穎溫度量測方法及其對傳輸機制之影響 A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
Authors:	江孟儒莊紹勳 Jiang, Meng-Ru Chung, Steve S. 電子研究所
Keywords:	自熱效應;可靠度;傳輸理論;電晶體溫度;self-heating effect;transport;temperature
Issue Date:	2017
URI:	http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070450122 http://hdl.handle.net/11536/142285
Appears in Collections:	Thesis