標題: 14奈米鰭式電晶體自熱效應的新穎溫度量測方法 及其對傳輸機制之影響
A New Temperature Measurement Technique of the Self-Heating Effect in 14nm FinFET and Its Impact on the Transport Mechanism
作者: 江孟儒
莊紹勳
Jiang, Meng-Ru
Chung, Steve S.
電子研究所
關鍵字: 自熱效應;可靠度;傳輸理論;電晶體溫度;self-heating effect;transport;temperature
公開日期: 2017
URI: http://etd.lib.nctu.edu.tw/cdrfb3/record/nctu/#GT070450122
http://hdl.handle.net/11536/142285
Appears in Collections:Thesis