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dc.contributor.authorAluguri, R.en_US
dc.contributor.authorKumar, D.en_US
dc.contributor.authorSimanjuntak, F. M.en_US
dc.contributor.authorTseng, T. Y.en_US
dc.date.accessioned2019-04-03T06:41:58Z-
dc.date.available2019-04-03T06:41:58Z-
dc.date.issued2017-09-01en_US
dc.identifier.issn2158-3226en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4994948en_US
dc.identifier.urihttp://hdl.handle.net/11536/143856-
dc.description.abstractAbipolar transistor selector was connected in series with a resistive switching memory device to study its memory characteristics for its application in cross bar array memory. The metal oxide based p-n-p bipolar transistor selector indicated good selectivity of about 10(4) with high retention and long endurance showing its usefulness in cross bar RRAM devices. Zener tunneling is found to be the main conduction phenomena for obtaining high selectivity. 1BT-1R device demonstrated good memory characteristics with non-linearity of 2 orders, selectivity of about 2 orders and long retention characteristics of more than 10(5) sec. One bit-line pull-up scheme shows that a 650 kb cross bar array made with this 1BT1R devices works well with more than 10 % read margin proving its ability in future memory technology application. (C) 2017 Author(s).en_US
dc.language.isoen_USen_US
dc.titleOne bipolar transistor selector - One resistive random access memory device for cross bar memory arrayen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4994948en_US
dc.identifier.journalAIP ADVANCESen_US
dc.citation.volume7en_US
dc.citation.issue9en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000412070600043en_US
dc.citation.woscount7en_US
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