標題: | The effect of asymmetrical electrode form after negative bias illuminated stress in amorphous IGZO thin film transistors (vol 110, 103502, 2017) |
作者: | Su, Wan-Ching Chang, Ting-Chang Liao, Po-Yung Chen, Yu-Jia Chen, Bo-Wei Hsieh, Tien-Yu Yang, Chung-I Huang, Yen-Yu Chang, Hsi-Ming Chiang, Shin-Chuan Chang, Kuan-Chang Tsai, Tsung-Ming 電子物理學系 Department of Electrophysics |
公開日期: | 10-Apr-2017 |
URI: | http://dx.doi.org/10.1063/1.4979076 http://hdl.handle.net/11536/145401 |
ISSN: | 0003-6951 |
DOI: | 10.1063/1.4979076 |
期刊: | APPLIED PHYSICS LETTERS |
Volume: | 110 |
Appears in Collections: | Articles |