| 標題: | A Novel Sealing Redistribution Layer Approach for Through-Glass via Fabrication |
| 作者: | Lee, Shih-Wei Chang, Geng-Ming Chang, Ching-Yun Chen, Kuan-Neng 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| 關鍵字: | Through-Glass via (TGV);redistribution layer;glass interposer;3D integration |
| 公開日期: | 1-Mar-2017 |
| 摘要: | A sealing redistribution layer (RDL) approach for the interposer fabrication is developed to simplify the conventional bottom-up process flow. By using this approach, bottom-up plating can achieve the integration of Cu-filler plating and its bottom RDL simultaneously. In this paper, through-glass via in glass interposer or 3-D integration is fabricated using the proposed approach. The electrical measurement and reliability tests indicate that the proposed approach can be an attractive candidate for interposer fabrication with great performance. |
| URI: | http://dx.doi.org/10.1109/JEDS.2017.2649605 http://hdl.handle.net/11536/145453 |
| ISSN: | 2168-6734 |
| DOI: | 10.1109/JEDS.2017.2649605 |
| 期刊: | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY |
| Volume: | 5 |
| Issue: | 2 |
| 起始頁: | 132 |
| 結束頁: | 135 |
| Appears in Collections: | Articles |
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