標題: | Atomic-scale epitaxial aluminum film on GaAs substrate |
作者: | Fan, Yen-Ting Lo, Ming-Cheng Wu, Chu-Chun Chen, Peng-Yu Wu, Jenq-Shinn Liang, Chi-Te Lin, Sheng-Di 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1-七月-2017 |
摘要: | Atomic-scale metal films exhibit intriguing size-dependent film stability, electrical conductivity, superconductivity, and chemical reactivity. With advancing methods for preparing ultra-thin and atomically smooth metal films, clear evidences of the quantum size effect have been experimentally collected in the past two decades. However, with the problems of small-area fabrication, film oxidation in air, and highly-sensitive interfaces between the metal, substrate, and capping layer, the uses of the quantized metallic films for further ex-situ investigations and applications have been seriously limited. To this end, we develop a large-area fabrication method for continuous atomic-scale aluminum film. The self-limited oxidation of aluminum protects and quantizes the metallic film and enables ex-situ characterizations and device processing in air. Structure analysis and electrical measurements on the prepared films imply the quantum size effect in the atomic-scale aluminum film. Our work opens the way for further physics studies and device applications using the quantized electronic states in metals. (C) 2017 Author(s). |
URI: | http://dx.doi.org/10.1063/1.4991435 http://hdl.handle.net/11536/145866 |
ISSN: | 2158-3226 |
DOI: | 10.1063/1.4991435 |
期刊: | AIP ADVANCES |
Volume: | 7 |
Issue: | 7 |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 期刊論文 |