完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Ker, Ming-Dou | en_US |
dc.contributor.author | Lin, Wan-Yen | en_US |
dc.contributor.author | Yen, Cheng-Cheng | en_US |
dc.contributor.author | Yang, Che-Ming | en_US |
dc.contributor.author | Chen, Tung-Yang | en_US |
dc.contributor.author | Chen, Shih-Fan | en_US |
dc.date.accessioned | 2018-08-21T05:56:38Z | - |
dc.date.available | 2018-08-21T05:56:38Z | - |
dc.date.issued | 2010-01-01 | en_US |
dc.identifier.issn | 2162-7673 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/146441 | - |
dc.description.abstract | A hardware/firmware system co-design has been proposed in this work to protect display electronic products against system-level electrostatic discharge (ESD) transient disturbance. By including transient detection circuit, the firmware can execute system recovery procedure to recover all electrical functions under system-level ESD tests. The transient detection circuit is designed to detect different positive and negative fast electrical transients and verified in a 0.13 mu m CMOS process. The experimental results have confirmed that the proposed hardware/firmware design can successfully improve the susceptibility of display products against system level ESD zapping. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Protection Design Against System-Level ESD Transient Disturbance on Display Panels | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2010 ASIA-PACIFIC INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY & TECHNICAL EXHIBITION ON EMC RF/MICROWAVE MEASUREMENTS & INSTRUMENTATION | en_US |
dc.citation.spage | 438 | en_US |
dc.citation.epage | 441 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000397213100112 | en_US |
顯示於類別: | 會議論文 |