標題: Reliability Analysis of GaN-based UVLEDs under forward bias operations in salty vapor environment
作者: Huang, Shen-Che
Li, Heng
Lee, Yu-Shan
Hung, Chen-Hao
Wang, Shing-Chung
Chen, Hsiang
Lu, Tien-Chang
光電工程學系
Department of Photonics
公開日期: 1-Jan-2017
摘要: We illustrated the reliability of longer wavelength ultraviolet light-emitting diodes (UVLEDs) in salty vapour environment under manipulation of forward-bias stress via consistent electrical and material characterizations. By manipulating the unprecedented operation in salty vapour ambient, we investigated a series of remarkable findings related to origin of failure behaviours.
URI: http://hdl.handle.net/11536/147165
期刊: 2017 22ND MICROOPTICS CONFERENCE (MOC)
起始頁: 306
結束頁: 307
Appears in Collections:Conferences Paper