標題: | Method for determining the fast axis and phase retardation of a wave plate |
作者: | Chiu, MH Chen, CD Su, DC 光電工程研究所 Institute of EO Enginerring |
公開日期: | 1-Sep-1996 |
摘要: | Based on the heterodyne interferometric technique and the discrimination technique of using two light beams with different wavelengths, a novel method for identifying the fast axis of a wave plate and evaluating its phase retardation is presented. Some of the merits of the method, such as, a simple optical setup, high stability, better resolution, and easier operation, are presented, and the validity of the method is demonstrated. (C) 1996 Optical Society of America. |
URI: | http://dx.doi.org/10.1364/JOSAA.13.001924 http://hdl.handle.net/11536/149287 |
ISSN: | 1084-7529 |
DOI: | 10.1364/JOSAA.13.001924 |
期刊: | JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION |
Volume: | 13 |
起始頁: | 1924 |
結束頁: | 1929 |
Appears in Collections: | Articles |