標題: Method for determining the fast axis and phase retardation of a wave plate
作者: Chiu, MH
Chen, CD
Su, DC
光電工程研究所
Institute of EO Enginerring
公開日期: 1-Sep-1996
摘要: Based on the heterodyne interferometric technique and the discrimination technique of using two light beams with different wavelengths, a novel method for identifying the fast axis of a wave plate and evaluating its phase retardation is presented. Some of the merits of the method, such as, a simple optical setup, high stability, better resolution, and easier operation, are presented, and the validity of the method is demonstrated. (C) 1996 Optical Society of America.
URI: http://dx.doi.org/10.1364/JOSAA.13.001924
http://hdl.handle.net/11536/149287
ISSN: 1084-7529
DOI: 10.1364/JOSAA.13.001924
期刊: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
Volume: 13
起始頁: 1924
結束頁: 1929
Appears in Collections:Articles