完整後設資料紀錄
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dc.contributor.authorPantel, Danielen_US
dc.contributor.authorChu, Ying-Haoen_US
dc.contributor.authorMartin, Lane W.en_US
dc.contributor.authorRamesh, Ramamoorthyen_US
dc.contributor.authorHesse, Dietrichen_US
dc.contributor.authorAlexe, Marinen_US
dc.date.accessioned2019-04-02T05:59:34Z-
dc.date.available2019-04-02T05:59:34Z-
dc.date.issued2010-04-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.3392884en_US
dc.identifier.urihttp://hdl.handle.net/11536/149947-
dc.description.abstractThe switching kinetics in epitaxial (001)-, (110)-, and (111)-oriented BiFeO3 thin films were investigated as a function of applied field and time. It was found that the ferroelectric switching behavior obeys the Kolmogorov-Avrami-Ishibashi theory only in the high field range. The detailed behavior depends on the film orientation. A comparison with standard systems, such as epitaxial Pb(Zr0.2Ti0.8)O-3 films, reveals some similarities as well as some differences. For instance, the presence of 109 degrees and 71 degrees ferroelastic domain walls might be ruled out as the source of the decrease in switched polarization at low applied fields, in contrast to what is the case for a/c domain walls in tetragonal Pb(Zr0.2Ti0.8)O-3. (C) 2010 American Institute of Physics. [doi:10.1063/1.3392884]en_US
dc.language.isoen_USen_US
dc.titleSwitching kinetics in epitaxial BiFeO3 thin filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.3392884en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume107en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000277303200086en_US
dc.citation.woscount28en_US
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