完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Pantel, Daniel | en_US |
dc.contributor.author | Chu, Ying-Hao | en_US |
dc.contributor.author | Martin, Lane W. | en_US |
dc.contributor.author | Ramesh, Ramamoorthy | en_US |
dc.contributor.author | Hesse, Dietrich | en_US |
dc.contributor.author | Alexe, Marin | en_US |
dc.date.accessioned | 2019-04-02T05:59:34Z | - |
dc.date.available | 2019-04-02T05:59:34Z | - |
dc.date.issued | 2010-04-15 | en_US |
dc.identifier.issn | 0021-8979 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.3392884 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/149947 | - |
dc.description.abstract | The switching kinetics in epitaxial (001)-, (110)-, and (111)-oriented BiFeO3 thin films were investigated as a function of applied field and time. It was found that the ferroelectric switching behavior obeys the Kolmogorov-Avrami-Ishibashi theory only in the high field range. The detailed behavior depends on the film orientation. A comparison with standard systems, such as epitaxial Pb(Zr0.2Ti0.8)O-3 films, reveals some similarities as well as some differences. For instance, the presence of 109 degrees and 71 degrees ferroelastic domain walls might be ruled out as the source of the decrease in switched polarization at low applied fields, in contrast to what is the case for a/c domain walls in tetragonal Pb(Zr0.2Ti0.8)O-3. (C) 2010 American Institute of Physics. [doi:10.1063/1.3392884] | en_US |
dc.language.iso | en_US | en_US |
dc.title | Switching kinetics in epitaxial BiFeO3 thin films | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.3392884 | en_US |
dc.identifier.journal | JOURNAL OF APPLIED PHYSICS | en_US |
dc.citation.volume | 107 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000277303200086 | en_US |
dc.citation.woscount | 28 | en_US |
顯示於類別: | 期刊論文 |