標題: Temporal universal conductance fluctuations in RuO2 nanowires due to mobile defects
作者: Lien, An-Shao
Wang, L. Y.
Chu, C. S.
Lin, Juhn-Jong
電子物理學系
物理研究所
Department of Electrophysics
Institute of Physics
公開日期: 17-Oct-2011
摘要: Temporal universal conductance fluctuations (TUCF's) are observed in RuO2 nanowires at cryogenic temperatures. The fluctuations persist up to very high T similar to 10 K. Their root-mean-square magnitudes increase with decreasing T, reaching similar to 0.2e(2)/h at T less than or similar to 2 K. These fluctuations are shown to originate from scattering of conduction electrons with rich amounts of mobile defects in artificially synthesized metal oxide nanowires. TUCF characteristics in both one-dimensional saturated and unsaturated regimes are identified and explained in terms of current theories. Furthermore, the TUCF's as a probe for the characteristic time scales of the mobile defects (two-level systems) are discussed.
URI: http://dx.doi.org/10.1103/PhysRevB.84.155432
http://hdl.handle.net/11536/150401
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.84.155432
期刊: PHYSICAL REVIEW B
Volume: 84
Issue: 15
起始頁: 0
結束頁: 0
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