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dc.contributor.authorHudec, Borisen_US
dc.contributor.authorChang, Che-Chiaen_US
dc.contributor.authorWang, I-Tingen_US
dc.contributor.authorFrohlich, Karolen_US
dc.contributor.authorHou, Tuo-Hungen_US
dc.date.accessioned2019-04-02T06:04:32Z-
dc.date.available2019-04-02T06:04:32Z-
dc.date.issued2018-01-01en_US
dc.identifier.issn1944-9399en_US
dc.identifier.urihttp://hdl.handle.net/11536/151045-
dc.description.abstractStorage-class memory, non-volatile, ultra-dense and lightning fast, may enable memory-driven computing to revolutionize the current architectures leading to an on-chip processing of vast amount of data. 3D vertical resistive random access memory (ReRAM) is a hot candidate for storage-class memory. In this talk we review current state-of-the-art works which offer promising solutions, utilizing either filamentary or non-filamentary ReRAM designs, including our own. We will discuss the pros and cons of different approaches and summarize the open problems, drawing possible solutions.en_US
dc.language.isoen_USen_US
dc.titleThree dimensional integration of ReRAMsen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2018 IEEE 18TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000458785600131en_US
dc.citation.woscount0en_US
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