Microcrystallinity of undoped amorphous silicon films and its effects on the transfer characteristics of thin film transistors

Full metadata record

DC Field	Value	Language
dc.contributor.author	Liang, CW	en_US
dc.contributor.author	Chiang, WC	en_US
dc.contributor.author	Feng, MS	en_US
dc.date.accessioned	2019-04-02T06:04:36Z	-
dc.date.available	2019-04-02T06:04:36Z	-
dc.date.issued	1995-01-01	en_US
dc.identifier.uri	http://hdl.handle.net/11536/151142	-
dc.language.iso	en_US	en_US
dc.title	Microcrystallinity of undoped amorphous silicon films and its effects on the transfer characteristics of thin film transistors	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	PROCEEDINGS OF THE FOURTH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1995BF21N00076	en_US
dc.citation.woscount	0	en_US
Appears in Collections:	Conferences Paper