標題: Evaluation of Metal/Polymer Adhesion and Highly Reliable Four-Point Bending Test Using Stealth Dicing Method in 3-D Integration
作者: Yang, Yi-Lun
Ito, Hiroyuki
Kim, Young Suk
Ohba, Takayuki
Chen, Kuan-Neng
交大名義發表
National Chiao Tung University
關鍵字: Polymers;Adhesives;Diamond;Silicon;Curing;Annealing;3-D integrated circuit (3-D IC);four-point bending;polymer adhesion
公開日期: 1-六月-2020
摘要: The adhesion between metal and polymer layer was studied using four-point bending tests. It was shown that as the annealing temperature increased, oxidation binding increased, which decreased adhesion and reduced the value. A new four-point bending test sample prepared using the stealth dicing method with a 100 & x0025; success rate was proposed for the first time. With samples prepared with stealth dicing, the region where crack extension occurred was smaller after the stress test. Less crack extension generated less loading on the samples. Owing to the coefficient of thermal expansion (CTE) mismatch after increasing the temperature in a highly accelerated stress test (HAST), a void formed in stealth dicing was made close to the interface between the silicon layer and the polymer layer after the stress test, and less crack extension occurred compared with samples kept at room temperature. The smaller loading force guarantees much more stable measurement with a higher success rate after the stress tests. The stealth dicing method can be applied to other structures, such as redistribution layers (RDLs).
URI: http://dx.doi.org/10.1109/TCPMT.2020.2968561
http://hdl.handle.net/11536/154923
ISSN: 2156-3950
DOI: 10.1109/TCPMT.2020.2968561
期刊: IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY
Volume: 10
Issue: 6
起始頁: 956
結束頁: 962
顯示於類別:期刊論文