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dc.contributor.authorChen, Min-Chengen_US
dc.contributor.authorChen, Hao-Yuen_US
dc.contributor.authorLin, Chia-Yien_US
dc.contributor.authorChien, Chao-Hsinen_US
dc.contributor.authorHsieh, Tsung-Fanen_US
dc.contributor.authorHorng, Jim-Tongen_US
dc.contributor.authorQiu, Jian-Taien_US
dc.contributor.authorHuang, Chien-Chaoen_US
dc.contributor.authorHo, Chia-Huaen_US
dc.contributor.authorYang, Fu-Liangen_US
dc.date.accessioned2014-12-08T15:22:44Z-
dc.date.available2014-12-08T15:22:44Z-
dc.date.issued2012-04-01en_US
dc.identifier.issn1424-8220en_US
dc.identifier.urihttp://hdl.handle.net/11536/16063-
dc.description.abstractThis paper reports a versatile nano-sensor technology using "top-down" poly-silicon nanowire field-effect transistors (FETs) in the conventional Complementary Metal-Oxide Semiconductor (CMOS)-compatible semiconductor process. The nanowire manufacturing technique reduced nanowire width scaling to 50 nm without use of extra lithography equipment, and exhibited superior device uniformity. These n type polysilicon nanowire FETs have positive pH sensitivity (100 mV/pH) and sensitive deoxyribonucleic acid (DNA) detection ability (100 pM) at normal system operation voltages. Specially designed oxide-nitride-oxide buried oxide nanowire realizes an electrically Vth-adjustable sensor to compensate device variation. These nanowire FETs also enable non-volatile memory application for a large and steady Vth adjustment window (>2 V Programming/Erasing window). The CMOS-compatible manufacturing technique of polysilicon nanowire FETs offers a possible solution for commercial System-on-Chip biosensor application, which enables portable physiology monitoring and in situ recording.en_US
dc.language.isoen_USen_US
dc.subjectnano-sensor fabricationen_US
dc.subjectnanowire FETen_US
dc.subjectnonvolatile memoriesen_US
dc.subjectsemiconductive sensorsen_US
dc.titleA CMOS-Compatible Poly-Si Nanowire Device with Hybrid Sensor/Memory Characteristics for System-on-Chip Applicationsen_US
dc.typeArticleen_US
dc.identifier.journalSENSORSen_US
dc.citation.volume12en_US
dc.citation.issue4en_US
dc.citation.epage3952en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000303309300012-
dc.citation.woscount4-
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