標題: | The First Order Optics of Novel Testing Equipment for Compact Camera Module |
作者: | Pan, Jui-Wen 光電系統研究所 Institute of Photonic System |
關鍵字: | compact camera module;magnification;reduction ratio;CMOS sensor |
公開日期: | 2010 |
摘要: | We proposed a modified testing equipment for adjusting the back focal length of compact camera module (CCM). The advantages of this modified testing equipment with conversion lens were testing space saving, small size testing chart, high speed chart changing, and variable object distances. The testing chart displacement of 0.17 mm in the modified testing equipment can produce the equivalent testing chart displacement of 1000 mm in the conventional testing equipment. At the regular object distance of 2000 mm, both total track and testing chart size of the modified test equipment were 1.6% of that of the conventional testing equipment. |
URI: | http://hdl.handle.net/11536/16324 http://dx.doi.org/10.1117/12.868798 |
ISBN: | 978-0-81948-082-8 |
ISSN: | 0277-786X |
DOI: | 10.1117/12.868798 |
期刊: | INTERNATIONAL OPTICAL DESIGN CONFERENCE 2010 |
Volume: | 7652 |
Appears in Collections: | Conferences Paper |
Files in This Item:
If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.