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dc.contributor.authorYeh, S. S.en_US
dc.contributor.authorLu, J. Y.en_US
dc.contributor.authorShiu, M. W.en_US
dc.contributor.authorLin, J. J.en_US
dc.date.accessioned2014-12-08T15:24:41Z-
dc.date.available2014-12-08T15:24:41Z-
dc.date.issued2006en_US
dc.identifier.isbn0-7354-0347-3en_US
dc.identifier.issn0094-243Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/17135-
dc.description.abstractWe have studied the temperature behavior of the electrical resistivities rho(T) in a series of tin-doped indium-oxide films with different residual resistivities rho(0) varying from 218 to 568 mu Omega cm. We found that the temperature dependence of p can be well described by the Bloch-Gruneisen law from 300 K down to about 100 K. In particular, we observed that the strength of the electron-phonon coupling, beta(BG), (which characterizes a prefactor in the Bloch-Gruneisen formula) increases linearly with increasing rho(0). This result is not understood in terms of current theoretical concept for electron-phonon interaction in metals.en_US
dc.language.isoen_USen_US
dc.subjectelectrical transporten_US
dc.subjectBloch-Gruneisen lawen_US
dc.subjectdisorderen_US
dc.titleElectrical transport in transparent conducting tin-doped indium oxide filmsen_US
dc.typeProceedings Paperen_US
dc.identifier.journalLow Temperature Physics, Pts A and Ben_US
dc.citation.volume850en_US
dc.citation.spage1548en_US
dc.citation.epage1549en_US
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentInstitute of Physicsen_US
dc.identifier.wosnumberWOS:000243396400704-
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