完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Yeh, S. S. | en_US |
dc.contributor.author | Lu, J. Y. | en_US |
dc.contributor.author | Shiu, M. W. | en_US |
dc.contributor.author | Lin, J. J. | en_US |
dc.date.accessioned | 2014-12-08T15:24:41Z | - |
dc.date.available | 2014-12-08T15:24:41Z | - |
dc.date.issued | 2006 | en_US |
dc.identifier.isbn | 0-7354-0347-3 | en_US |
dc.identifier.issn | 0094-243X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/17135 | - |
dc.description.abstract | We have studied the temperature behavior of the electrical resistivities rho(T) in a series of tin-doped indium-oxide films with different residual resistivities rho(0) varying from 218 to 568 mu Omega cm. We found that the temperature dependence of p can be well described by the Bloch-Gruneisen law from 300 K down to about 100 K. In particular, we observed that the strength of the electron-phonon coupling, beta(BG), (which characterizes a prefactor in the Bloch-Gruneisen formula) increases linearly with increasing rho(0). This result is not understood in terms of current theoretical concept for electron-phonon interaction in metals. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | electrical transport | en_US |
dc.subject | Bloch-Gruneisen law | en_US |
dc.subject | disorder | en_US |
dc.title | Electrical transport in transparent conducting tin-doped indium oxide films | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | Low Temperature Physics, Pts A and B | en_US |
dc.citation.volume | 850 | en_US |
dc.citation.spage | 1548 | en_US |
dc.citation.epage | 1549 | en_US |
dc.contributor.department | 物理研究所 | zh_TW |
dc.contributor.department | Institute of Physics | en_US |
dc.identifier.wosnumber | WOS:000243396400704 | - |
顯示於類別: | 會議論文 |