Title: IDENTIFYING UNTESTABLE FAULTS IN SEQUENTIAL-CIRCUITS
Authors: LIANG, HC
LEE, CL
CHEN, JE
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Issue Date: 1-Sep-1995
Abstract: This article proposes an efficient method to identify untestable faults in sequential circuits. It uses a controllability calculation and symbolic simulation procedure that propagates the characteristics of unknown initial flip-flop states throughout the circuit. Identifying flip-flops that cannot be initialized and circuit lines that cannot be justified to definite values, this process classifies and identifies four types of untestable faults. Experimental results show that it improves the efficiency of a test generation system.
URI: http://dx.doi.org/10.1109/MDT.1995.466367
http://hdl.handle.net/11536/1770
ISSN: 0740-7475
DOI: 10.1109/MDT.1995.466367
Journal: IEEE DESIGN & TEST OF COMPUTERS
Volume: 12
Issue: 3
Begin Page: 14
End Page: 23
Appears in Collections:Articles


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