完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chiang, KC | en_US |
dc.contributor.author | Lai, CH | en_US |
dc.contributor.author | Chin, A | en_US |
dc.contributor.author | Kao, HL | en_US |
dc.contributor.author | McAlister, SP | en_US |
dc.contributor.author | Chi, CC | en_US |
dc.date.accessioned | 2014-12-08T15:25:25Z | - |
dc.date.available | 2014-12-08T15:25:25Z | - |
dc.date.issued | 2005 | en_US |
dc.identifier.isbn | 0-7803-8845-3 | en_US |
dc.identifier.issn | 0149-645X | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/17807 | - |
dc.identifier.uri | http://dx.doi.org/10.1109/MWSYM.2005.1516582 | en_US |
dc.description.abstract | We have fabricated RF MIM capacitors, using high-kappa TiTAO as the dielectric, which show a record high density of 20 fF/mu m(2). In addition, the capacitors display a small capacitance reduction of only 3.6% over the 100 kHz to 20 GHz range, a low leakage current of 8 pA and a high Q of 120. This was for a typical large 8 pF TiTaO MINI capacitor. The small voltage dependence of the capacitance (Delta C/C) of 770 ppm at 2 GHz, shows that these MIM capacitors are useful for high-precision RF circuits. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | RF | en_US |
dc.subject | capacitor | en_US |
dc.subject | MIM | en_US |
dc.subject | TiTaO | en_US |
dc.title | Very high density RF MIM capacitor compatible with VLSI | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.doi | 10.1109/MWSYM.2005.1516582 | en_US |
dc.identifier.journal | 2005 IEEE MTT-S International Microwave Symposium, Vols 1-4 | en_US |
dc.citation.spage | 287 | en_US |
dc.citation.epage | 290 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000234561200066 | - |
顯示於類別: | 會議論文 |