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dc.contributor.authorChiang, KCen_US
dc.contributor.authorLai, CHen_US
dc.contributor.authorChin, Aen_US
dc.contributor.authorKao, HLen_US
dc.contributor.authorMcAlister, SPen_US
dc.contributor.authorChi, CCen_US
dc.date.accessioned2014-12-08T15:25:25Z-
dc.date.available2014-12-08T15:25:25Z-
dc.date.issued2005en_US
dc.identifier.isbn0-7803-8845-3en_US
dc.identifier.issn0149-645Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/17807-
dc.identifier.urihttp://dx.doi.org/10.1109/MWSYM.2005.1516582en_US
dc.description.abstractWe have fabricated RF MIM capacitors, using high-kappa TiTAO as the dielectric, which show a record high density of 20 fF/mu m(2). In addition, the capacitors display a small capacitance reduction of only 3.6% over the 100 kHz to 20 GHz range, a low leakage current of 8 pA and a high Q of 120. This was for a typical large 8 pF TiTaO MINI capacitor. The small voltage dependence of the capacitance (Delta C/C) of 770 ppm at 2 GHz, shows that these MIM capacitors are useful for high-precision RF circuits.en_US
dc.language.isoen_USen_US
dc.subjectRFen_US
dc.subjectcapacitoren_US
dc.subjectMIMen_US
dc.subjectTiTaOen_US
dc.titleVery high density RF MIM capacitor compatible with VLSIen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/MWSYM.2005.1516582en_US
dc.identifier.journal2005 IEEE MTT-S International Microwave Symposium, Vols 1-4en_US
dc.citation.spage287en_US
dc.citation.epage290en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000234561200066-
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