標題: Inversion MOS capacitance extraction for ultra-thin gate oxide using BSIM4
作者: Lee, W
Su, KW
Chiang, CS
Liu, S
Su, P
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2005
URI: http://hdl.handle.net/11536/18052
ISBN: 0-7803-9058-X
期刊: 2005 IEEE VLSI-TSA International Symposium on VLSI Technology (VLSI-TSA-TECH), Proceedings of Technical Papers
起始頁: 62
結束頁: 63
顯示於類別:會議論文