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dc.contributor.authorLai, CHen_US
dc.contributor.authorLee, CFen_US
dc.contributor.authorChin, Aen_US
dc.contributor.authorZhu, Cen_US
dc.contributor.authorLi, MFen_US
dc.contributor.authorMcAlister, SPen_US
dc.contributor.authorKwong, DLen_US
dc.date.accessioned2014-12-08T15:25:47Z-
dc.date.available2014-12-08T15:25:47Z-
dc.date.issued2004en_US
dc.identifier.isbn0-7803-8333-8en_US
dc.identifier.issn1529-2517en_US
dc.identifier.urihttp://hdl.handle.net/11536/18223-
dc.identifier.urihttp://dx.doi.org/10.1109/RFIC.2004.1320589en_US
dc.description.abstractA novel tunable and program-erasable high-kappa: AIN MIS capacitor is demonstrated for the first time with excellent tuning memory, which is useful to tune the impedance mismatching and resonance frequency without always connected voltage bias circuit. Large C-max /C-min tunability of 12 is obtained due to the high-kappa AIN dielectric with high 5 muF/mum(2) capacitance density. Good tuning memory is evidenced from the small V-th variation after program or erase at +4 V or -4 V for 10,000 s and the potential of years long extrapolated memory time.en_US
dc.language.isoen_USen_US
dc.titleA tunable and program-erasable capacitor on Si with excellent tuning memoryen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/RFIC.2004.1320589en_US
dc.identifier.journal2004 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERSen_US
dc.citation.spage259en_US
dc.citation.epage262en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000222534600058-
Appears in Collections:Conferences Paper


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