完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Wu, MS | en_US |
dc.contributor.author | Lee, CL | en_US |
dc.contributor.author | Chang, CP | en_US |
dc.contributor.author | Chen, JE | en_US |
dc.date.accessioned | 2014-12-08T15:26:28Z | - |
dc.date.available | 2014-12-08T15:26:28Z | - |
dc.date.issued | 2002 | en_US |
dc.identifier.isbn | 0-7695-1825-7 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/18786 | - |
dc.description.abstract | A test scheme for the crosstalk fault based on the oscillation signal is proposed. It uses an oscillation signal applied on an affecting line and detects induced pulses on a victim line if a crosstalk fault exists between these two lines. It is simple and eliminates the complicated timing issue during test generation for the crosstalk fault in the conventional approaches. The test generation and fault simulation based on the scheme are described. Experimental results are also presented to show the described test generation procedure is effective in generating test patterns for this scheme. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A testing scheme for crosstalk faults based on the oscillation test signal | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | PROCEEDINGS OF THE 11TH ASIAN TEST SYMPOSIUM (ATS 02) | en_US |
dc.citation.spage | 170 | en_US |
dc.citation.epage | 175 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000179973300029 | - |
顯示於類別: | 會議論文 |