An efficient test and diagnosis scheme for the feedback type of analog circuits with minimal added circuits

標題:	An efficient test and diagnosis scheme for the feedback type of analog circuits with minimal added circuits
作者:	Lin, JW Lee, CL Chen, JE 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	2002
URI:	http://hdl.handle.net/11536/18846
ISBN:	0-7695-1472-3
期刊:	DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, 2002 PROCEEDINGS
起始頁:	1119
結束頁:	1119
Appears in Collections:	Conferences Paper