標題: Extraction of noise source from noise parameters with RF CMOS devices
作者: Kao, YH
Hsu, MT
Hsu, YM
傳播研究所
Institute of Communication Studies
公開日期: 2001
摘要: The noise source extraction with two-port network of RF COMS devices is presented. We descried the correlation property with three different models. The correlation of noise source with the Y model and H model show the inductive characteristics, and the ABCD (transmission matrix) shows the capacitive characteristic. All the noise parameters are measured from 0.6G-6.0GHz.
URI: http://hdl.handle.net/11536/19081
ISBN: 0-7803-7138-0
期刊: APMC 2001: ASIA-PACIFIC MICROWAVE CONFERENCE, VOLS 1-3, PROCEEDINGS
起始頁: 1326
結束頁: 1329
顯示於類別:會議論文