標題: A power modeling and characterization method for the CMOS standard cell library
作者: Lin, JY
Shen, WZ
Jou, JY
交大名義發表
電子工程學系及電子研究所
National Chiao Tung University
Department of Electronics Engineering and Institute of Electronics
公開日期: 1996
摘要: In this paper, we propose power consumption models for complex gates and transmission gates, which are extended from the model of basic gates proposed in [1]. We also describe an accurate power characterization method for CMOS standard cell libraries which accounts for the effects of input slew rare, output loading, and logic state dependencies. The characterization methodology separates the power consumption of a cell into three components, e.g., capacitive feedthrough power, short-circuit power, and dynamic power. For each component, power equation is derived from SPICE simulation results where the netlist is extracted from cell's layout. Experimental results on a set of ISCAS'85 benchmark circuits show that the power estimation based on our power modeling and characterization provides within 7% error of SPICE simulation on average while the CPU time consumed is more than two orders of magnitude less.
URI: http://hdl.handle.net/11536/19856
ISBN: 0-8186-7597-7
ISSN: 1063-6757
期刊: 1996 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER-AIDED DESIGN - DIGEST OF TECHNICAL PAPERS
起始頁: 400
結束頁: 404
顯示於類別:會議論文