BOND-STRUCTURE CHANGES OF LIQUID-PHASE DEPOSITED OXIDE (SIO2-XFX) ON N2 ANNEALING

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	YEH, CF	en_US
dc.contributor.author	CHEN, CL	en_US
dc.contributor.author	LUR, W	en_US
dc.contributor.author	YEN, PW	en_US
dc.date.accessioned	2014-12-08T15:03:31Z	-
dc.date.available	2014-12-08T15:03:31Z	-
dc.date.issued	1995-02-20	en_US
dc.identifier.issn	0003-6951	en_US
dc.identifier.uri	http://dx.doi.org/10.1063/1.113603	en_US
dc.identifier.uri	http://hdl.handle.net/11536/2045	-
dc.language.iso	en_US	en_US
dc.title	BOND-STRUCTURE CHANGES OF LIQUID-PHASE DEPOSITED OXIDE (SIO2-XFX) ON N2 ANNEALING	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1063/1.113603	en_US
dc.identifier.journal	APPLIED PHYSICS LETTERS	en_US
dc.citation.volume	66	en_US
dc.citation.issue	8	en_US
dc.citation.spage	938	en_US
dc.citation.epage	940	en_US
dc.contributor.department	電子工程學系及電子研究所	zh_TW
dc.contributor.department	Department of Electronics Engineering and Institute of Electronics	en_US
dc.identifier.wosnumber	WOS:A1995QH86100012	-
dc.citation.woscount	12	-
顯示於類別：	期刊論文