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dc.contributor.authorLiu, Heng-Juien_US
dc.contributor.authorChen, Hsiang-Jungen_US
dc.contributor.authorLiang, Wen-Ien_US
dc.contributor.authorLiang, Chen-Weien_US
dc.contributor.authorLee, Hsin-Yien_US
dc.contributor.authorLin, Su-Jienen_US
dc.contributor.authorChu, Ying-Haoen_US
dc.date.accessioned2014-12-08T15:28:20Z-
dc.date.available2014-12-08T15:28:20Z-
dc.date.issued2012-09-01en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4746036en_US
dc.identifier.urihttp://hdl.handle.net/11536/20491-
dc.description.abstractWe report a study on the thermodynamic stability and structure analysis of the epitaxial BiFeO3 (BFO) thin films grown on YAlO3 (YAO) substrate. First, we observe a phase transition of M-C-M-A-T occurs in thin sample (<60 nm) with an utter tetragonal-like phase (denoted as M-II here) with a large c/a ratio (similar to 1.23). Specifically, MII phase transition process refers to the structural evolution from a monoclinic M-C structure at room temperature to a monoclinic M-A at higher temperature (150 degrees C) and eventually to a presence of nearly tetragonal structure above 275 degrees C. This phase transition is further confirmed by the piezoforce microscopy measurement, which shows the rotation of polarization axis during the phase transition. A systematic study on structural evolution with thickness to elucidate the impact of strain state is performed. We note that the YAO substrate can serve as a felicitous base for growing T-like BFO because this phase stably exists in very thick film. Thick BFO films grown on YAO substrate exhibit a typical "morphotropic-phase-boundary"-like feature with coexisting multiple phases (M-II, M-I, and R) and a periodic stripe-like topography. A discrepancy of arrayed stripe morphology in different direction on YAO substrate due to the anisotropic strain suggests a possibility to tune the MPB-like region. Our study provides more insights to understand the strain mediated phase co-existence in multiferroic BFO system. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4746036]en_US
dc.language.isoen_USen_US
dc.titleStructural study in highly compressed BiFeO3 epitaxial thin films on YAlO3en_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4746036en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume112en_US
dc.citation.issue5en_US
dc.citation.epageen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000309072200003-
dc.citation.woscount7-
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