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dc.contributor.authorChang, Hua-Yuen_US
dc.contributor.authorJiang, Iris Hui-Ruen_US
dc.contributor.authorChang, Yao-Wenen_US
dc.date.accessioned2014-12-08T15:28:29Z-
dc.date.available2014-12-08T15:28:29Z-
dc.date.issued2012-12-01en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCAD.2012.2209117en_US
dc.identifier.urihttp://hdl.handle.net/11536/20598-
dc.description.abstractDue to the rapidly increasing design complexity in modern integrated circuit design, more and more timing failures are detected at late stages. Without deferring time-to-market, metal-only engineering change order (ECO) is an economical technique to correct these late-found failures. Typically, a design might need to undergo many ECO runs in design houses; consequently, the usage of spare cells for ECO is of significant importance. In this paper, we aim at timing ECO by using as few spare cells as possible. We observe that a path with good timing is desired to be geometrically smooth. Unlike negative slack and gate delay used in most prior work, we propose a new metric of timing criticality, fixability, by considering the smoothness of timing violating paths. To measure the smoothness of a path, we use the Bezier curve as the golden path. Furthermore, in order to concurrently fix timing violations, we derive a propagation property to divide violating paths into independent segments. Based on Bezier curve smoothing, fixability identification, and the propagation property, we develop an efficient algorithm to fix timing violations. Experimental results show that we can effectively resolve all timing violations with significant speedups over the state-of-the-art works.en_US
dc.language.isoen_USen_US
dc.subjectEngineering change orderen_US
dc.subjectlogic synthesisen_US
dc.subjectphysical designen_US
dc.subjectspare cellen_US
dc.subjecttiming optimizationen_US
dc.titleTiming ECO Optimization Via Bezier Curve Smoothing and Fixability Identificationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCAD.2012.2209117en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSen_US
dc.citation.volume31en_US
dc.citation.issue12en_US
dc.citation.spage1857en_US
dc.citation.epage1866en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000311358700006-
dc.citation.woscount2-
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