標題: Design and implementation of configurable ESD protection cell for 60-GHz RF circuits in a 65-nm CMOS process
作者: Lin, Chun-Yu
Chu, Li-Wei
Ker, Ming-Dou
交大名義發表
National Chiao Tung University
公開日期: 1-八月-2011
摘要: The configurable electrostatic discharge (ESD) protection cells have been implemented in a commercial 65-nm CMOS process for 60-GHz RF applications. The distributed ESD protection scheme was modified to be used in this work. With the consideration of parasitic capacitance from I/O pad, the ESD protection cells have reached the 50-Omega input/output matching to reduce the design complexity for RF circuit designer and to provide suitable ESD protection. Experimental results of these ESD protection cells have successfully verified the ESD robustness and the RF characteristics in the 60-GHz frequency band. These ESD protection cells can easily be used for ESD protection design in the 60-GHz RF applications, and accelerate the design cycle. (C) 2011 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.microrel.2011.03.016
http://hdl.handle.net/11536/20782
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2011.03.016
期刊: MICROELECTRONICS RELIABILITY
Volume: 51
Issue: 8
起始頁: 1315
結束頁: 1324
顯示於類別:期刊論文


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