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dc.contributor.authorChang, Chih-Longen_US
dc.contributor.authorJiang, Iris Hui-Ruen_US
dc.date.accessioned2014-12-08T15:29:33Z-
dc.date.available2014-12-08T15:29:33Z-
dc.date.issued2013-02-01en_US
dc.identifier.issn0278-0070en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCAD.2012.2234828en_US
dc.identifier.urihttp://hdl.handle.net/11536/21255-
dc.description.abstractFlip-flops are the most common form of sequencing elements; however, they have a significantly higher sequencing overhead than latches in terms of delay, power, and area. Hence, pulsed latches are a promising option to reduce power for high-performance circuits. In this paper, to save power and compensate for timing violations, we fully utilize the intrinsic time borrowing property of pulsed latches and consider clock gating during pulsed-latch replacement. Experimental results show that our approach can generate very power efficient results.en_US
dc.language.isoen_USen_US
dc.subjectClock poweren_US
dc.subjectpulsed latchesen_US
dc.subjecttime borrowingen_US
dc.titlePulsed-Latch Replacement Using Concurrent Time Borrowing and Clock Gatingen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TCAD.2012.2234828en_US
dc.identifier.journalIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMSen_US
dc.citation.volume32en_US
dc.citation.issue2en_US
dc.citation.spage242en_US
dc.citation.epage246en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000314677400007-
dc.citation.woscount2-
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