標題: | Polycrystalline silicon thin-film transistor utilizing self-assembled monolayer for crystallization |
作者: | Tojo, Yosuke Miura, Atsushi Ishikawa, Yasuaki Yamashita, Ichiro Uraoka, Yukiharu 應用化學系 應用化學系分子科學碩博班 Department of Applied Chemistry Institute of Molecular science |
關鍵字: | Polycrystalline silicon;N-(2-aminoethyl)-3-aminopropyltrimethoxysilane;Self-assembled monolayers;Metal-induced lateral crystallization;Thin-film transistors |
公開日期: | 1-Jul-2013 |
摘要: | Crystallization employing an N-(2-aminoethyl)-3-aminopropyltrimethoxysilane self-assembled monolayer (AEAPS-SAM) to coordinate Ni metal catalyst was found to produce large grain poly-Si. A small concentration of Ni could be deposited controllably onto an AEAPS-SAM covered with Si by immersing it in Ni solution for 1-60 min. Larger grains and a lower Ni concentration in the poly-Si could be obtained by shorter immersion. Immersion for 1 min produced grains, as large as 47 mu m and a Ni concentration as low as 7.4 x 10(18) atoms/cm(3). A poly-Si thin-film transistor fabricated with AEAPS-SAMpoly-Si of 1 min immersion had a field-effect mobility of 98 cm(2)/(V s), which is one order of magnitude higher than that of a thin-film transistor fabricated without the AEAPS-SAM treatment. (C) 2013 Elsevier B. V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.tsf.2013.06.006 http://hdl.handle.net/11536/22244 |
ISSN: | 0040-6090 |
DOI: | 10.1016/j.tsf.2013.06.006 |
期刊: | THIN SOLID FILMS |
Volume: | 540 |
Issue: | |
起始頁: | 266 |
結束頁: | 270 |
Appears in Collections: | Articles |
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