標題: Source/Drain Series Resistance Induced Feedback Effect on Drain Current Mismatch and Its Implication
作者: Kuo, Jack J. -Y.
Fan, Ming-Long
Lee, Wei
Su, Pin
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2013
URI: http://hdl.handle.net/11536/22856
ISBN: 978-1-4673-3082-4
ISSN: 1524-766X
期刊: 2013 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS, AND APPLICATIONS (VLSI-TSA)
Appears in Collections:Conferences Paper