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dc.contributor.authorHu, Chih-Chiaen_US
dc.contributor.authorHaw, Khew Woeien_US
dc.contributor.authorWu, Chun-Yien_US
dc.contributor.authorChen, Chihen_US
dc.date.accessioned2014-12-08T15:35:17Z-
dc.date.available2014-12-08T15:35:17Z-
dc.date.issued2013en_US
dc.identifier.isbn978-1-4799-0667-3en_US
dc.identifier.issn2150-5934en_US
dc.identifier.urihttp://hdl.handle.net/11536/23914-
dc.description.abstractWe report a necking reliability issue in low-bump-height solder induced by reactive wetting of solder on Au finish in print circuit board. During reflow and solid state aging, the solders diffused to the Au finishes on the print circuit boards and reacted with Au to from Au-Sn compounds. Because the solder volume is very limited, this reaction took a lot of percentage of solders and caused necking of the solder joints. On the other hand, the joints without the Au layers have less necking problem. The necking will have detrimental effect on the mechanical properties of the solder joints. Therefore, it will be a serious reliability issue for flip-chip solder joints with low bump heights and microbumps in 3D IC.en_US
dc.language.isoen_USen_US
dc.titleNecking of low-bump-height solder induced by reactive wetting of solder on Au finishes in print circuit boarden_US
dc.typeProceedings Paperen_US
dc.identifier.journal2013 8TH INTERNATIONAL MICROSYSTEMS, PACKAGING, ASSEMBLY AND CIRCUITS TECHNOLOGY CONFERENCE (IMPACT)en_US
dc.citation.spage136en_US
dc.citation.epage139en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000333044600028-
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