完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hu, Chih-Chia | en_US |
dc.contributor.author | Haw, Khew Woei | en_US |
dc.contributor.author | Wu, Chun-Yi | en_US |
dc.contributor.author | Chen, Chih | en_US |
dc.date.accessioned | 2014-12-08T15:35:17Z | - |
dc.date.available | 2014-12-08T15:35:17Z | - |
dc.date.issued | 2013 | en_US |
dc.identifier.isbn | 978-1-4799-0667-3 | en_US |
dc.identifier.issn | 2150-5934 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/23914 | - |
dc.description.abstract | We report a necking reliability issue in low-bump-height solder induced by reactive wetting of solder on Au finish in print circuit board. During reflow and solid state aging, the solders diffused to the Au finishes on the print circuit boards and reacted with Au to from Au-Sn compounds. Because the solder volume is very limited, this reaction took a lot of percentage of solders and caused necking of the solder joints. On the other hand, the joints without the Au layers have less necking problem. The necking will have detrimental effect on the mechanical properties of the solder joints. Therefore, it will be a serious reliability issue for flip-chip solder joints with low bump heights and microbumps in 3D IC. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Necking of low-bump-height solder induced by reactive wetting of solder on Au finishes in print circuit board | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2013 8TH INTERNATIONAL MICROSYSTEMS, PACKAGING, ASSEMBLY AND CIRCUITS TECHNOLOGY CONFERENCE (IMPACT) | en_US |
dc.citation.spage | 136 | en_US |
dc.citation.epage | 139 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000333044600028 | - |
顯示於類別: | 會議論文 |