標題: Static Induction Transistor Using TaN Thin Film as Gate Electrode for High-Performance Application
作者: Zheng, Z. W.
Chen, Y. C.
光電系統研究所
Institute of Photonic System
關鍵字: static induction transistor (SIT);semiconductors;thin films;electrical properties
公開日期: 1-Mar-2014
摘要: In this study, static induction transistor (SIT) using TaN thin film as gate electrode was fabricated and the characteristics of this device were investigated. The electrical characteristics showed that the drain-source current was controlled by the bias voltage that applied to the TaN gate electrode. The typical SIT operations with non-saturation property and a transition from linear to nonlinear behavior were observed in the drain-source I-V characteristics. Furthermore, compared with the traditional devices, this SIT device can obtain a high working current (similar to 5 mA) at a low driving voltage (similar to 3 V) with a small threshold voltage (similar to 1 V), showing its high potential for high current and low voltage application.
URI: http://dx.doi.org/10.1007/s13391-013-3154-7
http://hdl.handle.net/11536/24006
ISSN: 1738-8090
DOI: 10.1007/s13391-013-3154-7
期刊: ELECTRONIC MATERIALS LETTERS
Volume: 10
Issue: 2
起始頁: 383
結束頁: 385
Appears in Collections:Articles