標題: | Static Induction Transistor Using TaN Thin Film as Gate Electrode for High-Performance Application |
作者: | Zheng, Z. W. Chen, Y. C. 光電系統研究所 Institute of Photonic System |
關鍵字: | static induction transistor (SIT);semiconductors;thin films;electrical properties |
公開日期: | 1-Mar-2014 |
摘要: | In this study, static induction transistor (SIT) using TaN thin film as gate electrode was fabricated and the characteristics of this device were investigated. The electrical characteristics showed that the drain-source current was controlled by the bias voltage that applied to the TaN gate electrode. The typical SIT operations with non-saturation property and a transition from linear to nonlinear behavior were observed in the drain-source I-V characteristics. Furthermore, compared with the traditional devices, this SIT device can obtain a high working current (similar to 5 mA) at a low driving voltage (similar to 3 V) with a small threshold voltage (similar to 1 V), showing its high potential for high current and low voltage application. |
URI: | http://dx.doi.org/10.1007/s13391-013-3154-7 http://hdl.handle.net/11536/24006 |
ISSN: | 1738-8090 |
DOI: | 10.1007/s13391-013-3154-7 |
期刊: | ELECTRONIC MATERIALS LETTERS |
Volume: | 10 |
Issue: | 2 |
起始頁: | 383 |
結束頁: | 385 |
Appears in Collections: | Articles |