Title: A 40 nm 0.32 V 3.5 MHz 11T Single-Ended Bit-Interleaving Subthreshold SRAM with Data-Aware Write-Assist
Authors: Chiu, Yi-Wei
Hu, Yu-Hao
Tu, Ming-Hsien
Zhao, Jun-Kai
Jou, Shyh-Jye
Chuang, Ching-Te
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
Issue Date: 2013
Abstract: This paper presents a new bit-interleaving 11T subthreshold SRAM cell with Data-Aware Power-Cutoff (DAPC) Write-assist to mitigate the leakage and variation and improve the Write-ability in deep sub-100nm technology. Measurement results from a 4 Kb test chip implemented in 40 nm General Purpose (40GP) CMOS technology operates for V-DD down to 0.32 V (similar to 0.69X of threshold voltage) with V-DDMIN limited by Read operation. The measured maximum operation frequency is 3.5 MHz (16.5 MHz) at 0.32 V (0.38 V) with total power consumption of 15.2 mu W (27.2 mu W) at 25 degrees C.
URI: http://hdl.handle.net/11536/24559
ISBN: 978-1-4799-1234-6; 978-1-4799-1235-3
Journal: 2013 IEEE INTERNATIONAL SYMPOSIUM ON LOW POWER ELECTRONICS AND DESIGN (ISLPED)
Begin Page: 51
End Page: 56
Appears in Collections:Conferences Paper