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dc.contributor.authorWang, SCen_US
dc.contributor.authorYeh, CFen_US
dc.contributor.authorHsu, CTen_US
dc.contributor.authorLou, JCen_US
dc.date.accessioned2014-12-08T15:37:09Z-
dc.date.available2014-12-08T15:37:09Z-
dc.date.issued2005en_US
dc.identifier.issn0013-4651en_US
dc.identifier.urihttp://hdl.handle.net/11536/25527-
dc.identifier.urihttp://dx.doi.org/10.1149/1.1860491en_US
dc.description.abstractThis work presents a novel method for transferring thin-film transistors (TFTs) from a Si wafer to another flexible plastic substrate. First, high-performance poly-Si TFTs were fabricated on a 1.5 mu m thick SiO2 on a Si wafer and then attached to a flexible plastic substrate by optical adhesive. Next, spin-etching was utilized to remove the backside Si, using SiO2 as a stopping layer. A qualitative model was established to explain the relationship between the chemical flow rate/rotation speed to the etching rate and the uniformity of Si removal. The Si etching rate exceeded 200 mu m/min while the Si to SiO2 selectivity of 250 was maintained given optimized spin-etching parameters. Substrate bonding and Si spin-etching steps caused no degradation or yield loss as compared to the electrical characteristics before transference. Additionally, extrinsic stress only weakly affected the properties of poly-Si resistors and TF`Ts on a flexible plastic substrate. (c) 2005 The Electrochemical Society. [DOI: 10. 1149/1.1860491] All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleFabricating thin-film transistors on plastic substrates using spin etching and device transferen_US
dc.typeArticleen_US
dc.identifier.doi10.1149/1.1860491en_US
dc.identifier.journalJOURNAL OF THE ELECTROCHEMICAL SOCIETYen_US
dc.citation.volume152en_US
dc.citation.issue3en_US
dc.citation.spageG227en_US
dc.citation.epageG233en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000227607300068-
dc.citation.woscount4-
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