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標題: ANALYSIS OF BILATERAL LATCH-UP TRIGGERING IN VLSI CIRCUITS
作者: HUANG, HS
CHANG, CY
HSU, CC
CHEN, KL
LIN, JK
電控工程研究所
Institute of Electrical and Control Engineering
公開日期: 1-Feb-1994
URI: http://hdl.handle.net/11536/2625
ISSN: 0038-1101
期刊: SOLID-STATE ELECTRONICS
Volume: 37
Issue: 2
起始頁: 380
結束頁: 382
Appears in Collections:Articles


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  • 一種存在於互補式超大型積體電路的雙橫向鎖住行為之探討 / 黃恆盛;Heng-Sheng Huang;張俊彥;C. Y. Chang
  • 一種存在於互補式超大型積體電路的雙橫向鎖住行為之探討 / 黃恆盛;HUANG, HENG-SHENG;張俊彥
  • THE BEHAVIOR OF BILATERAL LATCH-UP TRIGGERING IN VLSI ELECTROSTATIC DISCHARGE DAMAGE PROTECTION CIRCUITS / HUANG, HS;CHANG, CY;HSU, CC;CHEN, KL;LIN, JK
  • A STUDY ON BILATERAL LATCH-UP SELF-TRIGGERING IN COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR PROTECTION CIRCUITS / HUANG, HS;CHANG, CY;CHEN, KL;LIU, IO;HSU, CC
  • Improve Latch-up Immunity by Circuit Solution / Tsai, Hui-Wen;Ker, Ming-Dou
  • Active Guard Ring to Improve Latch-Up Immunity / Tsai, Hui-Wen;Ker, Ming-Dou
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