| 標題: | The Impact of Uniaxial Strain on Low Frequency Noise of Nanoscale PMOSFETs with e-SiGe and i-SiGe Source/Drain |
| 作者: | Yeh, Kuo-Liang Hong, Wei-Lun Guo, Jyh-Chyurn 交大名義發表 National Chiao Tung University |
| 公開日期: | 2010 |
| URI: | http://hdl.handle.net/11536/26698 |
| ISBN: | 978-1-4244-6057-1 |
| ISSN: | 0149-645X |
| 期刊: | 2010 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST (MTT) |
| Appears in Collections: | Conferences Paper |
- The Impact of Uniaxial Strain on Low Frequency Noise of Nanoscale PMOSFETs with e-SiGe and i-SiGe Source/Drain / Yeh, Kuo-Liang;Hong, Wei-Lun;Guo, Jyh-Chyum
- Impact of Uniaxial Strain on Low-Frequency Noise in Nanoscale PMOSFETs / Kuo, Jack J. -Y.;Chen, William P. -N.;Su, Pin
- Enhanced Carrier-Mobility-Fluctuation Origin Low-Frequency Noise in Uniaxial Strained PMOSFETs / Kuo, Jack J. -Y.;Chen, William P. -N.;Su, Pin
- Low Frequency Noise in Nanoscale pMOSFETs with Strain Induced Mobility Enhancement and Dynamic Body Biases / Yeh, Kuo-Liang;Ku, Chih-You;Hong, Wei-Lun;Guo, Jyh-Chyurn
- A Comprehensive Investigation of Analog Performance for Uniaxial Strained PMOSFETs / Kuo, Jack Jyun-Yan;Chen, William Po-Nien;Su, Pin
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