標題: A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples
作者: Pearn, WL
Lin, GH
工業工程與管理學系
Department of Industrial Engineering and Management
公開日期: 1-四月-2003
摘要: Process capability indices C-PU and C-PL are developed in the manufacturing industry to provide quantitative measures on process potential and performance. for processes with one-sided specification limits. Statistical properties of the estimators of C-PU and C-PL have been investigated extensively, but only restricted to cases with single samples. In this paper, we consider the estimation and capability testing of C-PU and C-PL based on multiple samples. We show that the proposed estimator of C-PU and C-PL are indeed the uniformly minimum variance unbiased estimators (UMVUEs). A simple procedure based on a hypothesis testing using the UMVUE is developed for the practitioners to use for judging whether a stable process meets the preset capability requirement. (C) 2002 Elsevier Science Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/S0026-2714(02)00323-2
http://hdl.handle.net/11536/27990
ISSN: 0026-2714
DOI: 10.1016/S0026-2714(02)00323-2
期刊: MICROELECTRONICS RELIABILITY
Volume: 43
Issue: 4
起始頁: 651
結束頁: 664
顯示於類別:期刊論文


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