| 標題: | A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples |
| 作者: | Pearn, WL Lin, GH 工業工程與管理學系 Department of Industrial Engineering and Management |
| 公開日期: | 1-四月-2003 |
| 摘要: | Process capability indices C-PU and C-PL are developed in the manufacturing industry to provide quantitative measures on process potential and performance. for processes with one-sided specification limits. Statistical properties of the estimators of C-PU and C-PL have been investigated extensively, but only restricted to cases with single samples. In this paper, we consider the estimation and capability testing of C-PU and C-PL based on multiple samples. We show that the proposed estimator of C-PU and C-PL are indeed the uniformly minimum variance unbiased estimators (UMVUEs). A simple procedure based on a hypothesis testing using the UMVUE is developed for the practitioners to use for judging whether a stable process meets the preset capability requirement. (C) 2002 Elsevier Science Ltd. All rights reserved. |
| URI: | http://dx.doi.org/10.1016/S0026-2714(02)00323-2 http://hdl.handle.net/11536/27990 |
| ISSN: | 0026-2714 |
| DOI: | 10.1016/S0026-2714(02)00323-2 |
| 期刊: | MICROELECTRONICS RELIABILITY |
| Volume: | 43 |
| Issue: | 4 |
| 起始頁: | 651 |
| 結束頁: | 664 |
| 顯示於類別: | 期刊論文 |

