| 標題: | CURRENT GAINS OF ALAS/GAAS TUNNELING EMITTER BIPOLAR-TRANSISTORS WITH 25-500-ANGSTROM BARRIER THICKNESS |
| 作者: | CHEN, HR LEE, CP CHANG, CY TSAI, KL TSANG, JS 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
| 關鍵字: | SEMICONDUCTOR DEVICES;HETEROJUNCTION BIPOLAR TRANSISTORS;TUNNELING STRUCTURES |
| 公開日期: | 14-十月-1993 |
| 摘要: | The current gain of an AlAs/GaS tunnelling emitter bipolar transistor (TEBT) is found to increase monotonically with barrier thickness in the range 25-200 angstrom and fall off for barrier thickness increasing from 200 to 500 angstrom. It is found that a thicker barrier can suppress the base-to-emitter hole injection better and increase the current gain, but a barrier which is too thick decreases the current gain due to the suppression of the electron current. |
| URI: | http://hdl.handle.net/11536/2820 |
| ISSN: | 0013-5194 |
| 期刊: | ELECTRONICS LETTERS |
| Volume: | 29 |
| Issue: | 21 |
| 起始頁: | 1883 |
| 結束頁: | 1884 |
| 顯示於類別: | 期刊論文 |

