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dc.contributor.authorLin, Gen_US
dc.contributor.authorLee, CPen_US
dc.date.accessioned2014-12-08T15:42:14Z-
dc.date.available2014-12-08T15:42:14Z-
dc.date.issued2002-07-01en_US
dc.identifier.issn0306-8919en_US
dc.identifier.urihttp://dx.doi.org/10.1023/A:1016181924302en_US
dc.identifier.urihttp://hdl.handle.net/11536/28681-
dc.description.abstractTwo-dimensional (2D) optical field distribution and the far-field patterns are analyzed for semiconductor lasers with small vertical beam divergence. The discrete spectral index method is used for the analysis and compared with other methods such as the effective index method. The discrete spectral index method is found to be much better in terms of accuracy and computation efficiency for the laser structures studied. Two laser structures with experimental counterparts are studied. The best beam aspect ratio (<1.5) is achieved using the conventional ridge waveguide process. The calculated results compare very favorably with the experimental results. Simulations also reveal the guidelines for design of symmetric optical beam.en_US
dc.language.isoen_USen_US
dc.subjectbeam aspect ratioen_US
dc.subjectbeam divergenceen_US
dc.subjectdiscrete spectral index methoden_US
dc.subjectridge waveguide laseren_US
dc.subjecttwo-dimensional analysisen_US
dc.titleTwo-dimensional field analysis of semiconductor lasers with small vertical beam divergenceen_US
dc.typeArticleen_US
dc.identifier.doi10.1023/A:1016181924302en_US
dc.identifier.journalOPTICAL AND QUANTUM ELECTRONICSen_US
dc.citation.volume34en_US
dc.citation.issue7en_US
dc.citation.spage661en_US
dc.citation.epage675en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000176779400003-
dc.citation.woscount0-
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