Investigation of Channel Backscattering Characteristics for Nanoscale SOI MOSFETs Using a New Temperature-Dependent Method

標題:	Investigation of Channel Backscattering Characteristics for Nanoscale SOI MOSFETs Using a New Temperature-Dependent Method
作者:	Lee, Wei Su, Pin 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics
公開日期:	2008
URI:	http://hdl.handle.net/11536/2874
ISBN:	978-1-4244-1954-8
ISSN:	1078-621X
期刊:	2008 IEEE INTERNATIONAL SOI CONFERENCE, PROCEEDINGS
起始頁:	73
結束頁:	74
顯示於類別：	會議論文